Treat your delicate solar cells with the care they deserve while maintaining great repeatability and control using one or more of PV Measurements' test fixtures.

PV Measurements Solar Cell I-V Curve Measurement Systems can be complemented by the addition of one or more test fixtures. Having the right test fixture allows you, the scientist, to easily mount samples and maintain the needed control to make accurate and precise measurements.

Possible Features:

  • Temperature control with both cooling and heating
  • All-back-contact (superstrate)
  • Spring loaded probes for front contact
  • Vacuum chuck mounting to the stage
  • Mounting holes to attach the fixture to the optics board
  • Invertible test fixtures for superstrate devices

Device types

Below are some examples of our test fixtures. Click the thumbnail for a larger picture.

Substrate devices with silicon like designsOrganic and other superstrate or all-back-contact devicesSubstrate devices and silicon cells.

This is your guide to selecting and configuring the optimum test fixtures for your measurements. Please use the tables below to guide you in the test fixture selection.

  denotes a standard feature and   denotes an optional feature. Please contact us for any custom requests.

Overview of test fixtures for solar cell quantum efficiency measurements and solar cell I-V measurements with features and options.
Temp. ControlStructure
Test Fixture Irradiance Monitor Min. Device Size [mm] Max. Device Size [mm] Water Plate Thermoelectric High Tempearture Substrate Rigid Superstrate Offset Sandwich
TFI-5M   5 50            
TFI-16M   5 160            
TFI-16P   5 160            
TFI-C   10 50            
TFI-BC   10 25            
TFI-F#   25 300            
Test device configuration overview.

Superstrate Device (All-Back-Contact)

Light goes through the superstrate material before reaching the photovoltaic material. Many thin-film devices are superstrate devices
Commonly used for: CdTe a-Si on glass, organic
TF Solution: TFQ-BU, TFQ-Flip and TFQ-BC, for QE. TFI-F or TFI-BC for I-V.

Insulating Substrate Device

Light reaches the photovoltaic material without going through the substrate material. Some thin-film devices are substrate devices
Commonly used for: CIGS
TF Solution: TFQ-5, TFQ-16 or TFQ-F for QE. TFI-5M, TFI-16M or TFI-F for I-V.

Conducting Substrate Device

Light reaches the photovoltaic material without going through the susbstrate material. Some thin-film devices are substrate devices
Commonly used for: a-Si and CIGS on steel or polymer
TF Solution: TFQ-5, TFQ-16 or TFQ-F for QE. TFI-5M, TFI-16M/P, TFI-16M/P or TFI-F for I-V.

Traditional Bulk Device

The photovoltaic material provides device structure. One terminal is on the front and the other on the back.
Commonly used for: c-SI, mc-Si, GaAs
TF Solutions: TFQ or TFQ-16 for QE. TFI-5M, TFI-16M/P/B3 or TFI-21M/P/B3 for I-V.
Note: PV Measurements can also provide custom test fixtures for bulk devices with both terminals on the back.

Offset-Sandwich DSC (DSSC)

Terminals are on the inside faces of the glass plates.
Commonly used for: Dye(-Sensitized) Solar Cells
TF Solutions: TFQ-5, TFQ-16 or TFQ-Cfor QE. TFI-5M, TFI-16M or TFI-C for I-V.

Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.

Call +1 303.386.3950 or email pvmsales@pvmeasurements.com to discuss your photovoltaic characterization needs.