TFI-P12 Automated Probe Card Vacuum Test Fixture for I-V Measurements

TFI-12P Probe Card Vacuum Test Fixture for I-V Measurements.

The 120 mm x 120 mm Probe Card Vacuum Test Fixture for I-V Systems is designed to hold and contact multiple devices with both the anode and cathode on the front of the device. The test fixture uses software to control which device is connected to the I-V Measurement System. As a part of the Integrated Test Station, the test fixture enables one- click QE/IPCE/SR and I-V measurements of multiple using a predefined measurement script. The fixture cmicromanipulator probe connections in less than 30 seconds.

Flexible Probing

A single test fixture can be provided with multiple probe cards or even a micromanipulator probe option to provide maximum "exibility in the types of devices to be probed. You can see two different confgurations of the same fixture in this brochure.

Automation Ready

The test fixture is compatible with PV Measurements QE and I-V systems and can be combined with an X-Y stage as show in the pictures here to enable quick measurements of multiple devices on a single substrate. Save measurement time and focus on the science.

Basic Temperature Control

The vacuum stage is mounted to a water circulation plate that can be used to control the temperature of the device being tested. Plumbing fittings are provided. To use this feature, the customer must supply a water circulator with temperature control for the water. Another option is to use thermoelectric temperature control, described below.

Optional Thermoelectric Temperature Control

With the optional thermoelectric temperature control, faster responsiveness and temperature precision are achieved. The thermoelectric modules act as a heat pump between the vacuum plate and the water plate. The water plate serves as the thermal reservoir for the thermoelectric modules. Two temperature ranges are available: The standard temperature control range allows control between 5 °C and 60 °C. The optional high temperature range allows the temperature of the test device to be raised up to 125 °C. These options include a water chiller. No external water connections are necessary.

Specifications

Specifications for the TFI-P12 Test Fixture for I-V Measurements
Electrical Interface to Measurement System 4 wire
Front Electrical Device Connection 17 software controlled Kelvin probes
Joystick micromanipulator probe, 2 included (additional probes optional)
Back Electrical Device Connection Kelvin probe from the front
Aluminum vacuum chuck for current measurements
Voltage probes embedded in chuck
Temperature Sensor AD590MF embedded in vacuum plate
Temperature Sensor Accuracy ± 0.5 °C
Temperature Sensor Precision ± 0.1 °C
Standard Range Thermoelectric Temperature Control 5 °C to 60 °C
Extended Range Thermoelectric Temperature Control 5 °C to 125 °C
Maximum Cell Size 160 mm x 160 mm
Minimum Cell Size 5 mm x 5 mm
Minimum Contact Pad 2 mm x 2 mm
Cell Style Substrate device (at least one front contact)
Soft Contact Conductive rubber

Compatible Device Structures

Insulating Substrate Device

Conducting Substrate Device

Traditional Bulk Device

Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.

Call +1 303.386.3950 or email pvmsales@pvmeasurements.com to discuss your photovoltaic characterization needs.