Map the EQE / IPCE / Spectral Response of Your Solar Cell

Sample from X-Y QE scan with a pin hole.

  • 16 cm x 16 cm cell standard, other sizes available
  • Single wavelength mapping
  • Multiple wavelength mapping
  • Full wavelength scans at multiple locations
  • Full automation
Measure the spatial variability of your cell's response to understand defects and variability in the cell structure.

The X-Y Scanning Accessory is available for both the QEX10 Solar Cell Spectral Response / Quantum Efficiency / IPCE Measurement System and the QEX10 Solar Cell Quantum Efficiency / IPCE / Spectral Response Measurement System. Using this accessory, one can scan the entire surface of a solar cell up to 15 cm x 15 cm dimensions (customization for other scanning areas is available).

This accessory reveals regions in the solar cell that have diminished response at some wavelengths but not others. Using this accessory, the user can scan the QE of the test device at any wavelength or at a set of wavelengths in the system’s range. After locating regions of concern, the user can perform more-resolved spatial and QE measurements to help diagnose device responsivity issues. The standard configuration can be used as a coarse LBIC scanning system.

Advanced use

These example images show X-Y scans of a 2 cm x 2 cm polycrystalline silicon solar cell at 7 different wavelengths. The maps show that the different crystal orientations have the greatest effect in the UV end of the spectrum. The QE graph shows the difference at two chosen positions (1 red, 2 blue) marked on the device photo. The scans were made using a pin hole to shrink the beam and a pre-amp to ensure proper signal strength.

Sample from X-Y QE scan with a pin hole.

Please tell us about your research application so that we can configure a QE system to best meet your needs. E-mail: pvmsales@pvmeasurements.com

Call +1 303.386.3950 or email pvmsales@pvmeasurements.com to discuss your photovoltaic characterization needs.