TFQ-F# Test Fixture for Quantum Efficiency Measurements of Superstrate Devices
The Flip Test Fixture is designed to hold and contact rigid superstrate test devices. The clamp holds samples up to 100 mm x 100 mm or 160 mm x 160 mm depending on the version chosen.
Spring probes contact the test device on either the front or back. Back contact devices are easily probed from the top while the device is upside down. Flip the fixture over to allow light to enter the device from above.
Soft Contacting for Delicate Devices
Some devices can be easily sctrached by the sharp, hard needles of micropositioner probes. Micropositioner probes from PV Measurements include a soft, electrically conductive device protector that can be used with the micropositioner to prevent scratching of delicate films.
|Electrical Interface||2 wire|
|Front Electrical Device Connection||Joystick micromanipulator probes (up to 2)|
|Back Electrical Device Connection||Joystick micromanipulator probes (up to 2)|
|Maximum Superstrate Size||100 mm x 100 mm (TFQ-F10)
160 mm x 160 mm (TFQ-F16)
|Minimum Superstrate Size||25 mm x 25 mm|
|Cell Style||Insulating superstrate device (all-back-contact)|
|Soft Contact||Conductive Rubber|
|Other Sizes||Custom sizes are available|
Insulating Superstrate Device
Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.