QEXL Solar Cell Quantum Efficiency / IPCE / Spectral Response Measurement System

QEXL Solar Cell Quantum Efficiency Measurement System.
  • 300 nm to 1100 nm scan range (1400 nm range available)
  • High resolution scan in under 1 minute
  • Probe beam from 1 mm to 20 mm
  • Seamless switching between DC and AC measurement modes
  • 1 Hz to 120 Hz chopping frequency
  • CE Marked

The QEXL Solar Cell Quantum Efficiency / IPCE / Spectral Response Measurement System is a low-cost, high-performance quantum efficiency measurement system, which is capable of delivering high speed measurements on most types of solar cells. The system is designed for fast, high accuracy measurements of dye sensitized, Perovskite, crystalline and amorphous silicon, CdTe, and similar devices.

This new design enables us to offer a QE measurement system for a lower price than previously possible while still delivering the same excellent quality and outstanding accuracy.

PVM_QEXL.pdf Download the QEXL Solar Cell Spectral Response / Quantum Efficiency / IPCE Measurement System brochure

Fast and Repeatable Measurements

Graph displaying the repeatability of measurements on the QEXL in a scan performed in under three minutes. Measure your cells fast with great repeatability. The graph here shows the results of 5 scans of a single crystalline silicon solar cell. Each scan was performed in 154 seconds. Faster scans can be acheived on many cell types without noticable loss of repeatability.

QEXL Features and Options

The table below gives an overview of QEXL standard and optional features.
denotes a standard feature.
denotes an optional feature.
Feature Standard or Optional
Xenon Arc Lamp   Standard Feature
5 nm spectral bandwidth   Standard Feature
300 nm – 1100 nm range   Standard Feature
1100 nm – 1400 nm range extension   Optional
Discrete beam size selection   Standard Feature
1 mm x 1 mm beam size   Standard Feature
1 mm x 5 mm beam size   Standard Feature
1 Hz – 120 Hz chopping frequency   Standard Feature
DC mode for DSSC devices   Optional
1 white bias light   Standard Feature
Spectral filters for bias light   Optional
Bias voltage up to ±3 V   Standard Feature
Integrated I-V measurement   Optional
Glovebox integration   Optional
Automated test sequence   Optional
Test fixtures   Optional
Test device temperature control   Optional

I-V Measurement Option

  • Fast setup
  • Integrated software

PV Measurements saves you time and money with the I-V Measurement Option. This enables the system to perform I-V Measurements on small devices, without changing any electrical connections or remounting the sample. For measurements with approximated light intensities, the built-in bias light can be used as the light source. Higher accuracy measurements can be achieved using a separate solar simulator, available from PV Measurements. Maximum current is 200 mA.

Measurement Automation

  • Quick scripting
  • Vary measurement conditions
  • Explore device stability
  • Dig deeper

The optional QEXL automation interface allows you to create measurement scripts to handle measurements of multiple devices under various test conditions as a single click operation. The interface enables seamless integration with PV Measurements I-V Measurement Systems and Test Fixtures to save you time in the lab. Please inquire about integration with third party hardware.

Convenient Beam Spot

QE probe beam nested between fingers on a silicon solar cell.
  • High spatial resolution
  • Discern between edge effects and bulk effects
  • Measure small samples with confidence

Chromatic abberation free all-reflective optics ensure that the beam size you see at your alignment wavelength is the beam size at all wavelengths. The convergent beam and variable beam sizes allow you to measure your sample with the beam size of your choice. Crystalline silicon researchers can therefore discern between the characteristics of a cell without gridlines from the characteristics with gridlines included to help understand the amount of loss caused by the gridlines.

Vacuum Test Fixtures

  • Fast sample mounts
  • Secure electrical contact
  • Soft probe tips for delicate devices
  • Sized for your device

With our convenient test fixtures, you don’t have to worry about mounting your samples. The vacuum test fixtures shown below are designed for substrate devices with one or more contacts on the side that the light comes from.

TFQ-5 vacuum test fixture for solar cell quantum efficiency measurements. TFQ-5 vacuum test fixture for solar cell quantum efficiency measurements.

  • Up to 5 cm cells
  • Thermoelectric temperature (optional)
  • Vacuum stage back contact

TFQ-16 vacuum test fixture for solar cell quantum efficiency measurements. TFQ-16 vacuum test fixture for solar cell quantum efficiency measurements.

  • Up to 16 cm cells
  • Thermoelectric temperature (optional)
  • Vacuum stage back contact

Multi-Channel Back-Contact Test Fixture

Test fixture for multiple back contact devices on a single superstrate.
  • Fast switching between devices
  • Quick sample mount
  • Highly repeatable contact
  • Exand with Integrated Test Station

Avoid the difficulty of probing small samples with this test fixture. The contact pins are always aligned to the device electrodes, and the sample channel is easily selectable through a software interface.

Glovebox Integration

Glovebox Accessory for QE Measurements.
  • Simple integration
  • Controlled environment
  • Fiber optic connection for maximum flexibility

Measuring your samples inside the glovebox enables you to save time by characterizing the device performance without the need to encapsulate the sample.

Please tell us about your research application so that we can configure a QE system to best meet your needs. E-mail: pvmsales@pvmeasurements.com

Call +1 303.386.3950 or email pvmsales@pvmeasurements.com to discuss your photovoltaic characterization needs.