TFI-C Test Fixture for I-V Measurements of Sandwich Style Devices

The Clamp Test Fixture for I-V Measurement Systems is designed to hold and contact sandwich-construction (Grätzel style) dye-sensitized solar cells (DSSC). The clamp holds samples up to 50 mm x 50 mm and a spring probe contacts one terminal on the edge of the test device. A clip contacts the other device terminal.

The fixture includes a metric, 150 mm, 0.499-inch diameter post for simple integration with PV Measurements Solar Cell I-V Curve Measurement Systems.

Reference Cell and Irradiance Monitor Mount

The fixture includes a provision for mounting the I-V Curve Measurement System’s irradiance monitor and a reference cell in the same plane as the test device.

Specifications

Specifications for the TFI-C Test Fixture for I-V Measurements of Sandwich Style Devices
Electrical Interface 2 wire
Front Electrical Device Connection Pring probe embedded in clamp
Back Electrical Device Connection Alligator clip style probe with no teeth
Maximum Cell Size 50 mm x 50 mm
Minimum Cell Size 10 mm x 10 mm
Cell Style Sandwich (Grätzel) style

Compatible Device Types

Graetzel / Offset Sandwich Style Device

Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.

Call +1 303.386.3950 or email pvmsales@pvmeasurements.com to discuss your photovoltaic characterization needs.