TFI-C Test Fixture for I-V Measurements of Sandwich Style Devices
The Clamp Test Fixture for I-V Measurement Systems is designed to hold and contact sandwich-construction (Grätzel style) dye-sensitized solar cells (DSSC). The clamp holds samples up to 50 mm x 50 mm and a spring probe contacts one terminal on the edge of the test device. A clip contacts the other device terminal.
The fixture includes a metric, 150 mm, 0.499-inch diameter post for simple integration with PV Measurements Solar Cell I-V Curve Measurement Systems.
Reference Cell and Irradiance Monitor Mount
The fixture includes a provision for mounting the I-V Curve Measurement System’s irradiance monitor and a reference cell in the same plane as the test device.
|Electrical Interface||2 wire|
|Front Electrical Device Connection||Pring probe embedded in clamp|
|Back Electrical Device Connection||Alligator clip style probe with no teeth|
|Maximum Cell Size||50 mm x 50 mm|
|Minimum Cell Size||10 mm x 10 mm|
|Cell Style||Sandwich (Grätzel) style|
Compatible Device Types
Graetzel / Offset Sandwich Style Device
Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.