TFI-16P Automated Vacuum Test Fixture for I-V Measurements
The 160 mm x 160 mm Pneumatic Vacuum Test Fixture for I-V Systems is designed to hold and contact crystalline silicon solar cells up to 160 mm x 160 mm in size. A platform with vacuum holes holds the test device and makes electrical contact to its rear surface. Three probing bars with adjustable spacing and containing multiple spring-loaded probes contact the busbars on the top of the test device.
Voltage probes embedded in the base and in the probing bars enable device voltage measurement. Solar cell fill factor measurements can depend on a variety of contacting factors. Though this test fixture is designed to enable accurate and repeatable fill factor measurements, we do not guarantee that this result will be achieved in all applications.
Use with Device Types Other than Crystalline Silicon
If the device under test does not have a terminal at its rear surface, custom probing bars can be designed to suit your needs. This test fixture is not suitable for use with superstrate devices, such as amorphous silicon on glass.Basic Temperature Control
The vacuum stage is mounted to a water circulation plate that can be used to control the temperature of the device being tested. Plumbing fittings are provided. To use this feature, the customer must supply a water circulator with temperature control for the water. Another option is to use thermoelectric temperature control, described below.
Optional Thermoelectric Temperature Control
With the optional thermoelectric temperature control, faster responsiveness and temperature precision are acheived. The termoelectric modules act as a heat pump between the vacuum plate and the water plate. The water plate serves as the thermal reservoir for the thermoelectric modules. Two temperature ranges are available: The standard temperature control range allows control between 5 °C and 60 °C. The optional high temperature range allows the temperature of the test device to be raised up to 125 °C. These options include a water chiller. No external water connections are necessary.
Test the quality of your busbars and gridlines by running a current from one busbar to another. Add this option to your electronic load based Solar Cell I-V Measurement Systems and TFI-16P test fixture to help identify and diagnose metallization issues.
Reduced Shade Probing
The probing bars for the busbar may cause a shadow, slightly wider than the busbar to be cast on the solar cell to be measured. The low shade probe option enables the measurement of Isc with the least amount of shading possible.
Mounting the Test Fixture
The 160 mm x 160 mm Vacuum Test Fixture for I-V Systems has 6.1 mm diameter holes in its base that can be used to mount it in a fixed position relative to the solar simulator.
|Compressed Clean Dry Air||70 PSI, 5 l/min|
|Vacuum Pump Electricity||0.5 A, 115 VAC or 0.25 A, 250 VAC 50/60 Hz|
|Water Plate Flow Rate||0.5 l/min|
|Optional Standard Range Thermoelectric
Temperature Controller And Water Chiller
|8 A, 115 VAC or 6 A, 250 VAC 50/60 Hz|
|Optional Extended Range Thermoelectric Temperature Controller And Water Chiller||10 A, 115 VAC or 6 A, 250 VAC 50/60 Hz|
|Electrical Interface||4 wire|
|Front Electrical Device Connection||Joystick micromanipulator probe, 2 included (additional probes optional)|
|Back Electrical Device Connection||Aluminum vacuum chuck for current measurements
Voltage probes embedded in chuck
|Temperature Sensor||LM335 embedded in vacuum plate|
|Temperature Sensor||Accuracy ± 0.5 °C|
|Standard Range Thermoelectric Temperature Control||5 °C to 60 °C|
|Extended Range Thermoelectric Temperature Control||5 °C to 125 °C|
|Maximum Cell Size||160 mm x 160 mm|
|Minimum Cell Size||5 mm x 5 mm|
|Cell Style||Substrate device (at least one front contact)|
|Soft Contact||Conductive rubber|
Insulating Substrate Device
Conducting Substrate Device
Traditional Bulk Device
Contact your PV Measurements representative for more details on test fixtures and which one is the best for your application.